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Figure 1 | BMC Research Notes

Figure 1

From: Analysis of stress-induced duplex destabilization (SIDD) properties of replication origins, genes and intergenes in the fission yeast, Schizosaccharomyces pombe

Figure 1

Variability patterns of SIDD profiles in sliding and fixed windows. (A-C) Variability of SIDD profiles of Ori1098 in sliding windows. Note that the deep SIDD valley corresponding to the origin (grey bar) in the center of a 5-kb window (A) becomes shallow on sliding 1 kb from left to right (B) and shallower on sliding 1kb from right to left (C). (D-F) The locations of the SIDD valleys show little or no alteration although their depths change to different extents between 5-kb and 10-kb windows centered on an origin.

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BMC Research Notes

ISSN: 1756-0500

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