Figure 3From: Analysis of stress-induced duplex destabilization (SIDD) properties of replication origins, genes and intergenes in the fission yeast, Schizosaccharomyces pombeOrigins are more susceptible to SIDD than NOIRs and genes. (A) Distribution patterns of the lowest G(x) values of 564 origins (ChIP-chip origins and AT-islands) [25, 28] (black dots), 440 weak origins [37] (grey dots), 434 NOIRs (magenta dots) and 360 genes (cyan dots). (B) The graph of AT% vs lowest G(x) values of the four analyzed entities, ChIP-chip origins and ATislands (black dots), weak origins (grey dots), NOIRs (magenta dots) and genes (cyan dots) in the 5-kb context.Back to article page