Skip to main content
Figure 3 | BMC Research Notes

Figure 3

From: Analysis of stress-induced duplex destabilization (SIDD) properties of replication origins, genes and intergenes in the fission yeast, Schizosaccharomyces pombe

Figure 3

Origins are more susceptible to SIDD than NOIRs and genes. (A) Distribution patterns of the lowest G(x) values of 564 origins (ChIP-chip origins and AT-islands) [25, 28] (black dots), 440 weak origins [37] (grey dots), 434 NOIRs (magenta dots) and 360 genes (cyan dots). (B) The graph of AT% vs lowest G(x) values of the four analyzed entities, ChIP-chip origins and ATislands (black dots), weak origins (grey dots), NOIRs (magenta dots) and genes (cyan dots) in the 5-kb context.

Back to article page