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Table 1 Averages of the lowest SIDD values, sizes and AT contents of different entities

From: Analysis of stress-induced duplex destabilization (SIDD) properties of replication origins, genes and intergenes in the fission yeast, Schizosaccharomyces pombe

Entities

Number analyzed

Average lowest G(x) value (kcal/mol)

Average size (bp)

AT content (%)

% of entities containing lowest G(x) point

ChIP - chip origins & AT islands (OIRs)

576 (564)*

1.85

2284

69.98

91

Weak origins (OIRs)

440

2.46

1323

69.56

67

NOIRs

434

3.16

1536

67.93

43

Genes

360

8.47

1359

60.9

2

  1. *564 SIDD values for 576 origins because 2 adjacent origins were considered as one, in 11 cases.
  2. Averages of the lowest G(x) values, sizes and AT% of the OIRs, NOIRs and genes, and the % of these entities containing the lowest G(x) point in a 5-kb window centered on the entity.