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Figure 2 | BMC Research Notes

Figure 2

From: Analysis of stress-induced duplex destabilization (SIDD) properties of replication origins, genes and intergenes in the fission yeast, Schizosaccharomyces pombe

Figure 2

Representative patterns of the SIDD profiles of different genomic entities. (A-G) origins, (H) a NOIR and, (I) a gene. All these origins except (D) and (G) are 2D-gel proven. The locations of the origins/AT islands are marked with grey bars. Note in (G) the presence of a deep SIDD valley not overlapping but close to Ori1003, one of the four origins found to be highly stable in this study.

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BMC Research Notes

ISSN: 1756-0500

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