Figure 5From: Analysis of stress-induced duplex destabilization (SIDD) properties of replication origins, genes and intergenes in the fission yeast, Schizosaccharomyces pombeOther closely spaced stress-destabilized intergenes show SIDD interactions akin to the ura4 origin region. SIDD profiles of two ChIP-chip origins, Ori1092 (rip1) and Ori1047 (ars1), to check the interactions between the closely spaced stress destabilized intergenes following in silico deletions. In case of Ori1092, the intergenes were deleted in silico and replaced with ura4 gene somewhat mimicking the experiments done in [18]. The locations of the origins (dark grey bar), other SIDD valleys (light grey bar) and genes (top) are shown (S. pombe GeneDB). The lowest G(x) values are mentioned below the valleys.Back to article page